%A WEI Jin-Peng,E Wen-Di,LIU Zhang-Xiong,GUAN Rong-Xia,CHANG Ru-Zhen,QIU Li-Juan %T
Analysis of Introgressed Segments in Near-Isogenic Lines Carrying Soybean Maturity Genes
%0 Journal Article %D 2010 %J Acta Agronomica Sinica %R 10.3724/SP.J.1006.2010.00233 %P 233-241 %V 36 %N 2 %U {https://zwxb.chinacrops.org/CN/abstract/article_4436.shtml} %8 2010-02-10 %X
It is very important to exploit the soybean maturity genes for developing varieties with high-yield and wide adaptability in both theory and practice. The objective of the study was to identify the size and position of introgressed segments associating with maturity genes, which provides information of fine mapping and cloning maturity genes. Twenty-three introgression lines (near isogenic lines, NILs) carrying four soybean maturity genes and their recurrent parent, were analyzed with 243 SSR markers, and 266 introgression segments were found, so each NIL containing 11.6 introgressed segments on average. The majority of 150 introgressed segments with E1, were located on chromosome 6, while 55, 49; 73 introgressed segments with E2, e3, E5on chromosomes 20, 12 and 20 respectively. The NILs with the same maturity gene trended to cluster together. The results showed that E1 was related to the interval of satt643–sat_312 on chromosome 6 and sat_095 on chromosome 11; both E2 and E5 loci associated with the interval of satt587–satt496 on chromosome 20; e3 was related to the interval of satt317–satt181 on chromosome 12. Therefore, E1 locus was validated with NILs, anda new markerrelated to E1 was detected, and E2, e3, E5 gene-related markers were identified.