栽培甜菜助细胞退化进程的超微结构观察

李伟^1,², 申家恒^2,^*, 郭德栋³

Ultrastructure of Synergid in Its Degenerative Process in Sugar Beet (Beta vulgaris)

LI Wei^1,², SHEN Jia-Heng^2,^*, GUO De-Dong³

图版II A~D: 图版I中图E的局部放大, 图A, B示开始退化助细胞的胞质Bar = 200 nm; 图C, D示宿存助细胞中的胞质Bar = 500 nm。E, F: 一个助细胞完全退化, 一个助细胞宿存, 箭头示卵细胞合点端的电子浓密物质图E, Bar = 5 μm; 图F, Bar = 2 μm。
Plate II A-D: Higher magnification of Figure E in Plate I, Figure A and B show cytoplasm of the degenerated synergid; Figure C and D show cytoplasm of the persistant synergid Bar = 500 nm. E, F: One synergid degenerated completely, the other persisted, electronic dense material at chalazal end of egg cell shown by arrows Figure E, Bar = 5 μm; Figure F, Bar = 2 μm.