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作物学报 ›› 2008, Vol. 34 ›› Issue (02): 212-216.doi: 10.3724/SP.J.1006.2008.00212

• 作物遗传育种·种质资源·分子遗传学 • 上一篇    下一篇

小麦抗叶锈病基因Lr24的一个新STS标记

张娜;陈玉婷;李亚宁;张立荣;孟庆芳;张汀;杨文香*;刘大群*   

  1. 河北农业大学植物病理系分子植物病理学实验室/河北省农作物病虫害生物防治工程技术研究中心, 河北保定 071001

  • 收稿日期:2007-01-15 修回日期:1900-01-01 出版日期:2008-02-12 网络出版日期:2008-02-12
  • 通讯作者: 刘大群

A Novel STS Marker for Leaf Rust Resistance Gene Lr24 in Wheat

ZHANG Na,CHEN Yu-Ting,LI Ya-Ning,ZHANG Li-Rong,MENG Qing-Fang,ZHANG Ting,YANG Wen-Xiang*,LIU Da-Qun*
  

  1. Laboratory of Molecular Phytopathology, Department of Plant Pathology, Agricultural University of Hebei/ Biological Control Centre of Plant Diseases and Pests of Hebei Province, Baoding 071001, Hebei, China

  • Received:2007-01-15 Revised:1900-01-01 Published:2008-02-12 Published online:2008-02-12
  • Contact: LIU Da-Qun

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1849

被引次数

18

摘要：

来源于长穗偃麦草的基因Lr24对小麦叶锈病具有很高的抗性, 本研究旨在开发用于Lr24基因分子标记辅助育种的新的分子标记。从定位于小麦3D染色体的22对SSR、EST-SSR引物中筛选出4对揭示TcLr24多态性的引物, 用468株F2抗感群体对这4对引物进一步检测, 得到1个与Lr24共分离的EST-SSR标记Xcwem17。对该标记进行测序, 并设计了STS引物。用该STS引物及已知的Lr24 SCAR引物对试验群体进行验证, 两对引物在该F2群体中均表现共分离, 且Xcwem17可在TcLr24单基因系和已知含Lr24的农家品种泰山1号中可扩增出180 bp单一条带, 感病对照及其余7个近等基因系无扩增。该EST-SSR标记可直接用于分子标记辅助选择。

关键词:

小麦叶锈病, 抗病基因, Lr24, 分子标记辅助选择

Abstract:

Wheat (Triticum aestivum L.) leaf rust, caused by Puccinia triticina (formerly P. recondita f. sp. tritici), is one of the most destructive diseases on wheat production throughout the world. The use of resistant varieties is an economical, efficient and environmental-friendly way for minimizing the losses caused by wheat leaf rust. To date, about 90 leaf rust resistance genes have been found or identified in wheat and its relatives. The resistance gene Lr24, derived from Thinopyrum ponticum (2n = 70), confers very strong resistance to wheat leaf rust. Eight molecular markers of Lr24 have been developed, however more markers are needed for identifying and mapping the gene. In the present study, Xcwem17 was discovered as a new EST-SSR marker of Lr24 with the susceptible line Thatcher and 468 individuals of F2 progeny derived from a cross between TcLr24 and Thatcher. The wheat seedlings of parents and F2 generation were inoculated solely with leaf rust spores, and cultured in greenhouse at (20±5)℃. The infection types (IT) of all plant materials were scored in six grades with Roelfs’s system at the 14th day after inoculation. Twenty-two pairs of SSR and EST-SSR primer on wheat chromosome 3D were used to tag the resistance gene Lr24. One of the four polymorphism primers co-segregated with Lr24 was acquired after testing with 468 F2 individuals. Sequence analysis showed that Xcwem17 was 223 bp, in which from the 7th to 220th bp (coding 71 amino acid residues) showed 36% identity to a poly-protein gene of rice chromosome 5. The marker Xcwem17 was further converted into a STS marker, and tested together with a reported SCAR marker in the same population. The results showed that they both co-segregated with Lr24, and could amplify a single 310-bp (SCAR marker) or 180-bp (STS marker) band only in TcLr24 and Taishan 1 (a landrace carried Lr24). It suggests that the STS marker developed in the study can be used in MAS directly.

Key words:

Puccinia triticina, Resistance gene, Lr24, Marker-assisted selection

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