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Acta Agron Sin ›› 2004, Vol. 30 ›› Issue (05): 455-459.

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Measurement of Wheat Hardness by Near Infrared Transmittance Spectroscopy

CHEN Feng;HE Zhong-Hu;CUI Dang-Qun   

  1. Institute of Crop Breeding and Cultivation/National Wheat Improvement Center, Chinese Academy of Agriculture Sciences, Beijing 100081
  • Received:2002-12-04 Revised:2003-04-20 Online:2004-05-12 Published:2004-05-12
  • Contact: HE Zhong-Hu

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Abstract: 583 samples of wheat cultivars from major wheat production area collected in 2001 and 2002 seasons were used to measure kernel hardness by near infrared transmittance（NIT）spectroscopy. Two algorithms, i.e. partial least squares and multiple linear regression, and three variable transformations, i.

Key words: Near infrared transmittance spectroscopy (NITS), Calibration model, Common wheat, Hardness

CLC Number: 

  • S512
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